Electron Microscopy Sciences | 1560 Industry Road | Hatfield, PA 19440 | P 215-412-8400 | F 215-412-8450 | info@emsdiasum.com

© 2019

PERSONAL SHORT COURSES

All Available Courses

  • General Lab Skills [1 day]

    • Solution preparation

    • Molar, Normal, %, stock dilutions, and multi component

    • Glassware, pipettes, and mixing

    • Weighing and pH adjustments

  • Microscopy OLM [1 day]

    • Nature of light

    • Optics and objective correction level

    • Kohler alignment

    • Focus and digital image collection

  • Sample Preparation [1 day] - Featuring the EMS 9000 Microwave

    • Trimming

    • Orientation determination

    • Fixation for OLM and TEM

    • Resin embeddment

  • Microtomy [2 days] - Featuring the Leica EM UC 7 and RMC/Boeckeler Power Tome PC

    • Thick sectioning (0.5-1.5 um) for OLM

    • Chromatic staining for OLM

    • Thin section (70-40 nm) for TEM - using DiATOME Diamond Knives

    • Post staining for TEM contrast

  • Transmission Electron Microscope (TEM) [2 days] - Featuring the Hitachi 7700

    • Electron optics

    • Aberrations and astigmatisms

    • Beam specimen interaction / image formation

    • Column alignment

    • Focus and astigmatism correction

    • Digital image collection

    • Artifact identification

  • Scanning Electron Microscope (SEM) [2 days] - Featuring the Hitachi SU 3500

    • Chemical specimen processing

    • Critical Point Drying (CPD) and HMDS - using K850 CPD

    • Physical specimen processing

    • Freeze Drying (FD) - using K750X FD and Q150T sputter coater

    • SEM Instrument

    • Beam / specimen interaction theory

    • Instrument parameters ( kV, spot size/beam current, WD, tilt)

    • Signal/ Mode selection SE, BSE, VP, UVD

    • Focus and astigmatism adjustment

  • Cryo SEM [1 day] - Featuring the PP3010

    • Cryo sample prep

    • Cryo transfer, fracture, coating

    • SEM cryo stage and imaging

  • X-ray Microanalysis [1 day] - Featuring the Bruker Esprit (SDD) and X-Flash SDD

    • Generation and nomenclature

    • Qualitative analysis

    • Quantitative analysis (ZAF)