This course will introduce participants to methods of sample preparation and SEM parameters and operation needed for accurate analysis.
Tuesday - Thursday
March 17 - 19, 2020
8:30 a.m. - 4:30 p.m.
Hatfield, Pennsylvania, USA
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Individuals who currently perform or will be responsible for the preparation of samples and/or operation of the SEM in a research, academic, or industrial setting.
The EMS Microscopy Academy
Located in Hatfield, Pennsylvania, the Academy provides electron microscopy classes, workshops and training sessions for all fields of microscopy, including materials science and biological science.
Lecture, demonstration and hands-on practice, as well as round table discussion. Participants are encouraged to bring their own samples, if possible.
- Identification and isolation of ROI
- Theory and hands-on chemical processing
- Theory and hands-on CPD, HMDS, and Hitachi's ionic liquid
- Theory and hands-on freeze drying
- Theory and hands-on Sputter coating
- SEM theory and discussion of parameters affecting image quality
- Demonstration and hands-on practice of SEM operation and effects of parameters
- Theory and demonstration and hands-on practice of variable pressure and Hitachi's ionic liquid
- Hitachi SU 3500 SEM
- K850 CPD
- EMS 9000 Microwave
- Q150T ES Plus Sputter Coater
Registration will be limited to a maximum of 15 participants.
EMS will provide samples to those who prefer not to bring their own
Biological SEM: A Complete Picture
The preparation of samples will start with determination of ROI and subsequent selection of gross cut orientation and determination of which dehydration technique to use: freeze drying, HMDS, Hitachi’s ionic liquid or critical point drying (CPD). The chemical processing required before CPD will be stressed. Special attention will be paid to orientation, stability and grounding of the sample when mounting to facilitate ease of imaging. The advantages, disadvantages and instrument requirements for the various coating materials: Au, Pt, Pt/Pd will be discussed.
Selection of accelerating voltage (kV) and spot size are critical for surface detail, resolution, and charging and will be covered in detail. Parameters such as working distance for depth of field (Dfi) and resolution, plus tilt and raster rotate will be examined for proper image collection.